Andreas_Wolf wrote:
Shrinking process node decreases vulnerability to total-ionizing-dose radiation but increases vulnerability to other kinds of radiation effects like single-event upset or single-event latchup. Thus, radiation hardening is still a necessary thing for space microelectronics and probably always will be. The specific hardening methods have changed over time with the ever-shrinking process nodes, though.

https://en.wikipedia.org/wiki/Radiation_hardening#Digital_damage:_SEE